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MillenTech CTI Group News


ISO/IEC Working Group 1: Regensburg, Germany

Card Testing International - Featured News Archive Jul 26, 2017 | 16:01 pm

CTO Steve DeDera was pleased to have been a direct attendee and contributor to this invited ISO expert Working Group. This was a tri-annual expert[…]

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Measurement Accuracy Explained

Card Testing International - Featured News Archive Apr 23, 2017 | 15:34 pm

  Inconclusive, Near Limits, Not Applicable, Borderline… These are just some of the terms used to describe test results approaching the pass/fail limits defined by[…]

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Card Surface Wear

Card Testing International - Featured News Archive Mar 23, 2017 | 17:39 pm

Todays cards encounter surface wear caused by a variety of circumstances; how the cards are stored, the environments the cards are used in, what devices[…]

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Meet us at the Orlando Payments Summit #204

Card Testing International - Featured News Archive Mar 10, 2017 | 08:51 am

CTI is proud to be exhibiting at the Smart Card Alliance Payments Summit being held 28th – 30th March, at the Renaissance Orlando at Sea[…]

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CTI hosts the next ISO/IEC Meeting

Card Testing International - Featured News Archive Jan 12, 2017 | 17:15 pm

As the New Zealand national delegates, CTI are privileged to host expert representatives from around the world, in our hometown of Wellington City, for the[…]

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